Ultrahigh-density atomic force microscopy data storage with erase capability

被引:220
作者
Binnig, G [1 ]
Despont, M
Drechsler, U
Häberle, W
Lutwyche, M
Vettiger, P
Mamin, HJ
Chui, BW
Kenny, TW
机构
[1] IBM Corp, Div Res, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland
[2] IBM Corp, Almaden Res Ctr, Div Res, San Jose, CA 95120 USA
[3] Stanford Univ, Stanford, CA 94305 USA
关键词
D O I
10.1063/1.123540
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report a simple atomic force microscopy-based concept for a hard disk-like data storage technology. Thermomechanical writing by heating a Si cantilever in contact with a spinning polycarbonate disk has already been reported. Here the medium has been replaced with a thin polymer layer on a Si substrate, resulting in significant improvements in storage density. With this new medium, we achieve bit sizes of 10-50 nm, leading to data densities of 500 Gbit/in.(2). We also demonstrate a novel high-speed and high-resolution thermal readback method, which uses the same Si cantilevers that are used in the writing process, and the capability to erase and rewrite data features repeatedly. (C) 1999 American Institute of Physics. [S0003-6951(99)00109-6].
引用
收藏
页码:1329 / 1331
页数:3
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