Observations of accelerated silicon carbide recession by oxidation at high water-vapor pressures

被引:143
作者
More, KL [1 ]
Tortorelli, PF [1 ]
Ferber, MK [1 ]
Keiser, JR [1 ]
机构
[1] Oak Ridge Natl Lab, Div Met & Ceram, Oak Ridge, TN 37831 USA
关键词
D O I
10.1111/j.1151-2916.2000.tb01172.x
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A study of the exposure of SiC at 1200 degrees C and high water-vapor pressures (1.5 atm) has shown SiC recession rates that exceed what is predicted based on parabolic oxidation at water-vapor pressures of less than or equal to similar to 1 atm. After exposure to these conditions, distinct silica-scale structures are observed; thick, porous, nonprotective cristobalite scales form above a thin, dense silica layer. The porous cristobalite thickens with exposure time, while the thickness of the underlying dense layer remains constant. These observations suggest a moving-boundary phenomenon that is controlled by the rapid conversion of dense vitreous silica to a porous, nonprotective crystalline SiO2.
引用
收藏
页码:211 / 213
页数:3
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