Structural characterization of a new layered-ternary Ta4AlC3 ceramic

被引：78

作者：

Lin, Z. J.

Zhuo, M. J.

Zhou, Y. C. ^{[1
]}

Li, M. S.

Wang, J. Y.

机构：

[1] Chinese Acad Sci, Met Res Inst, Sneyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China

[2] Chinese Acad Sci, Grad Sch, Beijing 100039, Peoples R China

来源：

JOURNAL OF MATERIALS RESEARCH | 2006年 / 21卷 / 10期

关键词：

MICROSTRUCTURAL CHARACTERIZATION; OXIDATION BEHAVIOR; CARBIDES; TI4ALN3; SOLIDS; TI2ALC;

D O I：

10.1557/JMR.2006.0310

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Bulk TaAlC3, a new layered-ternary carbide in the Ta-Al-C system, was synthesized and characterized. Transmission electron microscopy investigations on this new phase are reported here. Selected area electron diffraction and convergent beam electron diffraction analyses indicated that this ternary carbide crystallized with the space group P6(3)/mmc. Atomic-scale microstructures of Ta4AlC3 were achieved by means of high-resolution transmission electron microscopy and Z-contrast scanning transmission electron microscopy. The experimental crystal structural parameters agreed well with the theoretical values obtained using density-functional calculations.

引用

页码：2587 / 2592

页数：6

共 26 条

[1]

[Anonymous], 2006, 30 INT C ADV CER COM

[2] SYMMETRY AND CRYSTAL-STRUCTURE OF TI3SIC2 [J].