Interdiffusion studies in GaAsP/GaAs and GaAsSb/GaAs superlattices under various arsenic vapor pressures

被引:16
作者
Egger, U
Schultz, M
Werner, P
机构
[1] UNIV LEIPZIG, INST ANORGAN CHEM, D-04103 LEIPZIG, GERMANY
[2] NIPPON TELEGRAPH & TEL PUBL CORP, LSI LABS, ATSUGI, KANAGAWA 24301, JAPAN
关键词
D O I
10.1063/1.364453
中图分类号
O59 [应用物理学];
学科分类号
摘要
Interdiffusion coefficients on the group V sublattice of GaAs were determined in GaAsP/GaAs and GaAsSb/GaAs superlattices, Strained GaAs0.86P0.14/GaAs, GaAs0.8P0.2/GaAs0.975P0.025 and GaAs0.98Sb0.02/GaAs superlattices were annealed between 850 degrees C and 1100 degrees C under different arsenic vapor pressures. The diffusion coefficient was measured by secondary ion mass spectroscopy and cathodoluminescence spectroscopy. The interdiffusion coefficient was higher under arsenic-rich conditions than under gallium-rich conditions, pointing to an interstitial-substitutional type of diffusion mechanism. (C) 1997 American Institute of Physics.
引用
收藏
页码:6056 / 6061
页数:6
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