ROD:: A program for surface X-ray crystallography

被引：300

作者：

Vlieg, E ^{[1
]}

机构：

[1] Catholic Univ Nijmegen, Dept Solid State Chem, RIM, NL-6525 ED Nijmegen, Netherlands

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2000年 / 33卷

关键词：

D O I：

10.1107/S0021889899013655

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A brief description is given of the C-program ROD with which surface structures can be refined on the basis of X-ray data. All main features one encounters on surfaces, like roughness, relaxations, reconstructions and multiple domains, are taken into account. The program has proven to be a useful tool over the past ten years. (C) 2000 International Union of Crystallography Printed in Great Britain - all rights reserved.

引用

页码：401 / 405

页数：5

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