Simplified area function for sharp indenter tips in depth-sensing indentation

被引：70

作者：

Thurn, J ^{[1
]}

Cook, RF ^{[1
]}

机构：

[1] Univ Minnesota, Dept Chem Engn & Mat Sci, Minneapolis, MN 55455 USA

来源：

JOURNAL OF MATERIALS RESEARCH | 2002年 / 17卷 / 05期

关键词：

D O I：

10.1557/JMR.2002.0169

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A two-parameter "area function" characterizing the depth-dependent projected area of an indenter was introduced and applied to a Berkovich tip. The two parameters have physical meaning, corresponding to the effective tip radius and effective cone angle. The indenter tip was calibrated on a commercial load-controlled Nano Indenter(R) XP (MTS Systems Corp., Eden Prairie, MN). All calibrations were carried out using the procedure of Oliver and Pharr [J. Mater. Res. 7, 1564 (1992)] using several homogeneous materials. Plane-strain modulus and hardness values deconvoluted from indentation load-displacement traces using the calibrated two-parameter area function compared well with the values determined using the empirical eight-parameter area function of Oliver and Pharr.

引用

页码：1143 / 1146

页数：4

共 10 条

[1] Influences of pileup on the measurement of mechanical properties by load and depth sensing indentation techniques [J].

Bolshakov, A ;

Pharr, GM .

JOURNAL OF MATERIALS RESEARCH, 1998, 13 (04) :1049-1058

[2] A method for interpreting the data from depth-sensing indentation instruments [J].

Doerner, M. F. ;

Nix, W. D. .

JOURNAL OF MATERIALS RESEARCH, 1986, 1 (04) :601-609

[3] Effect of phase transformations on the shape of the unloading curve in the nanoindentation of silicon [J].

Domnich, V ;

Gogotsi, Y ;

Dub, S .

APPLIED PHYSICS LETTERS, 2000, 76 (16) :2214-2216

[4]

ENDERS S, 2000, MAT RES SOC S P, V649

[5] Progress in determination of the area function of indenters used for nanoindentation [J].

Herrmann, K ;

Jennett, NM ;

Wegener, W ;

Meneve, J ;

Hasche, K ;

Seemann, R .

THIN SOLID FILMS, 2000, 377 :394-400

[6] The effect of the indenter load on the nanohardness of ductile metals: an experimental study on polycrystalline work-hardened and annealed oxygen-free copper [J].

Lim, YY ;

Chaudhri, MM .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1999, 79 (12) :2979-3000

[7] AN IMPROVED TECHNIQUE FOR DETERMINING HARDNESS AND ELASTIC-MODULUS USING LOAD AND DISPLACEMENT SENSING INDENTATION EXPERIMENTS [J].

OLIVER, WC ;

PHARR, GM .

JOURNAL OF MATERIALS RESEARCH, 1992, 7 (06) :1564-1583

[8] THE MECHANICAL-BEHAVIOR OF SILICON DURING SMALL-SCALE INDENTATION [J].

PHARR, GM ;

OLIVER, WC ;

CLARKE, DR .

JOURNAL OF ELECTRONIC MATERIALS, 1990, 19 (09) :881-887

[9] NEW EVIDENCE FOR A PRESSURE-INDUCED PHASE-TRANSFORMATION DURING THE INDENTATION OF SILICON [J].

PHARR, GM ;

OLIVER, WC ;

HARDING, DS .

JOURNAL OF MATERIALS RESEARCH, 1991, 6 (06) :1129-1130

[10] Characterization of Vickers, Berkovich, spherical and cube cornered diamond indenters by nanoindentation and SFM [J].

Riester, L ;

Bridge, RJ ;

Breder, K .

FUNDAMENTALS OF NANOINDENTATION AND NANOTRIBOLOGY, 1998, 522 :45-50

← 1 →