Modeling of transport in polycrystalline organic semiconductor films

被引:167
作者
Verlaak, S
Arkhipov, V
Heremans, P
机构
[1] IMEC, B-3001 Louvain, Belgium
[2] Katholieke Univ Leuven, Dept Elect Engn, Louvain, Belgium
关键词
D O I
10.1063/1.1541112
中图分类号
O59 [应用物理学];
学科分类号
摘要
We propose a grain-boundary barrier model with an energy distribution of interfacial traps to describe charge transport in polycrystalline organic thin films. The model is applied to the interpretation of charge transport in unintentionally doped pentacene films. It gives an acceptable explanation for the concomitant increase in threshold voltage and mobility, and allows an understanding of the difference between the dopant-concentration and gate-voltage dependences of the mobility. (C) 2003 American Institute of Physics.
引用
收藏
页码:745 / 747
页数:3
相关论文
共 12 条
[1]   TRANSPORT PROPERTIES OF POLYCRYSTALLINE SILICON FILMS [J].
BACCARANI, G ;
RICCO, B ;
SPADINI, G .
JOURNAL OF APPLIED PHYSICS, 1978, 49 (11) :5565-5570
[2]   MULTIPLE TRAPPING IN STRONG ELECTRIC-FIELDS [J].
ESIPOV, SE .
PHYSICAL REVIEW B, 1991, 44 (15) :7930-7934
[3]  
Horowitz G, 2000, ADV MATER, V12, P1046, DOI 10.1002/1521-4095(200007)12:14<1046::AID-ADMA1046>3.0.CO
[4]  
2-W
[5]   Temperature and gate voltage dependence of hole mobility in polycrystalline oligothiophene thin film transistors [J].
Horowitz, G ;
Hajlaoui, ME ;
Hajlaoui, R .
JOURNAL OF APPLIED PHYSICS, 2000, 87 (09) :4456-4463
[6]   CONDUCTIVITY BEHAVIOR IN POLYCRYSTALLINE SEMICONDUCTOR THIN-FILM TRANSISTORS [J].
LEVINSON, J ;
SHEPHERD, FR ;
SCANLON, PJ ;
WESTWOOD, WD ;
ESTE, G ;
RIDER, M .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (02) :1193-1202
[7]   Pentacene-based organic thin-film transistors [J].
Lin, YY ;
Gundlach, DJ ;
Nelson, SF ;
Jackson, TN .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1997, 44 (08) :1325-1331
[8]   Hall mobility minimum of temperature dependence in polycrystalline silicon [J].
Nussbaumer, H ;
Baumgartner, FP ;
Willeke, G ;
Bucher, E .
JOURNAL OF APPLIED PHYSICS, 1998, 83 (01) :292-296
[9]  
ORTON JW, 1980, REP PROG PHYS, V43, P1265
[10]  
Schön JH, 1999, APPL PHYS LETT, V74, P260, DOI 10.1063/1.123274