Applied physics - High-speed atomic force microscopy

被引:143
作者
Hansma, Paul K. [1 ]
Schitter, Georg
Fantner, Georg E.
Prater, Craig
机构
[1] Univ Calif Santa Barbara, Dept Phys, Santa Barbara, CA 93106 USA
[2] Veeco Instruments Inc, Goleta, CA 93117 USA
关键词
CANTILEVERS;
D O I
10.1126/science.1133497
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
[No abstract available]
引用
收藏
页码:601 / 602
页数:2
相关论文
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