X-ray diffraction studies of epitaxial La0.5Sr0.5CoO3 thin films prepared by the dipping-pyrolysis process

被引：4

作者：

Hwang, K

Lee, H

Ryu, H

Lim, Y

Yamaguchi, I

Manabe, T

Kumagai, T

Mizuta, S

机构：

[1] Chonnam Natl Univ, Dept Ceram Engn, Kwangju 500757, South Korea

[2] Kwangju Hlth Coll, Dept Ophthalm Opt, Kwangju 506701, South Korea

[3] Natl Inst Mat & Chem Res, Inorgan Mat Div, Tsukuba, Ibaraki 3058575, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1999年 / 38卷 / 11期

关键词：

La0.5Sr0.5CoO3 thin film; epitaxy; reciprocal-space map;

D O I：

10.1143/JJAP.38.6489

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A reciprocal-space map (omega-2 theta scans) can provide more information than conventional X-ray diffraction (XRD) theta-2 theta scans. In this study, an epitaxial La0.5Sr0.5CoO3 thin film prepared on the SrTiO3(100) substrate by the dipping-pyrolysis (DP) process was investigated based on XRD theta-2 theta scanning, beta scanning (pole figure) and asymmetric omega-2 theta scanning. An epitaxial La0.5Sr0.5CoO3 film annealed at 800 degrees C was found to consist of the pseudocubic phase with a d(parallel to)/d(perpendicular to) ratio of 1.005 by reciprocal-space map analysis.

引用

页码：6489 / 6490

页数：2

共 8 条

[1] Ferroelectric field effect in ultrathin SrRuO3 films [J].