Ion-implanted waveguides in Nd3+-doped silicate glass and Er3+/Yb3+ co-doped phosphate glass

被引：33

作者：

Chen, F ^{[1
]}

Wang, XL

Li, XS

Hu, LL

Lu, QM

Wang, KM

Shi, BR

Shen, DY

机构：

[1] Shandong Univ, Dept Phys, Jinan 250100, Peoples R China

[2] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China

[3] Shandong Univ, Sch Chem& Chem Engn, Jinan 250100, Peoples R China

[4] Peking Univ, Minist Educ, Dept Tech Phys, Key Lab Heavy Ion Phys, Beijing 100871, Peoples R China

来源：

APPLIED SURFACE SCIENCE | 2002年 / 193卷 / 1-4期

基金：

中国国家自然科学基金;

关键词：

optical waveguide; ion implantation; refractive index profile; Nd3+-doped silicate glass; Er3+/Yb3+ co-doped phosphate glass;

D O I：

10.1016/S0169-4332(02)00212-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The data are presented on the waveguides formation in the Nd3+-doped silicate glass and Er3+/Yb3+ co-doped phosphate glass by the implantations of He+ or Si+ ions, respectively. The prism-coupling method is used to measure the effective refractive indices of the waveguide dark modes. The refractive index profiles of the waveguides are reconstructed by using the reflectivity calculation method (RCM) and a comparison of such profiles among the different waveguides has been made. The reasons for the formation of the present waveguides are analyzed in a primary way. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：92 / 101

页数：10

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