Intergranular films at Au-sapphire interfaces

被引:52
作者
Baram, Mor [1 ]
Kaplan, Wayne D. [1 ]
机构
[1] Technion Israel Inst Technol, Dept Mat Engn, IL-32000 Haifa, Israel
关键词
D O I
10.1007/s10853-006-0897-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The existence of nanometer- thick amorphous equilibrium films at metal-ceramic interfaces has been experimentally verified for the Au-Al(2)O(3) system. The films were formed using a novel experimental approach, in which thin sputtered films of Au were dewetted on a sapphire substrate which was previously partially wetted with drops of anorthite glass (CaO-2SiO(2)-Al(2)O(3)). High-resolution transmission electron microscopy and qualitative analytical transmission electron microscopy were used to confirm the existence of the amorphous films. In addition, positive and relatively large Hamaker constants were calculated for the Au-film-Al(2)O(3) interface, which indicates the existence of an attractive van der Waals force which stabilizes the film, similar to equilibrium films at grain boundaries in ceramics. A similar to 1 nm thick surface film was also detected on the (0001) surface of sapphire substrates partially wetted by anorthite glass. The refractive index required to stabilize the surface films, via a positive Hamaker constant, is explored.
引用
收藏
页码:7775 / 7784
页数:10
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