Pore size distributions in nanoporous methyl silsesquioxane films as determined by small angle x-ray scattering

被引:85
作者
Huang, E
Toney, MF
Volksen, W
Mecerreyes, D
Brock, P
Kim, HC
Hawker, CJ
Hedrick, JL
Lee, VY
Magbitang, T
Miller, RD
Lurio, LB
机构
[1] IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA
[2] No Illinois Univ, Dept Phys, De Kalb, IL 60115 USA
关键词
D O I
10.1063/1.1507841
中图分类号
O59 [应用物理学];
学科分类号
摘要
Small angle x-ray scattering (SAXS) measurements were performed on nanoporous methyl silsesquioxane films that were generated by the incorporation of a sacrificial polymeric component into the matrix and subsequently removed by thermolysis. The average pore radii ranged from 1 to 5 nm over a porosity range of similar to5-50%. The distribution in pore size was relatively broad and increases in breadth with porosity. The values and observations obtained by SAXS are in good agreement with field emission scanning electron microscopy. (C) 2002 American Institute of Physics.
引用
收藏
页码:2232 / 2234
页数:3
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