Holographic recording in indium-oxide (In2O3) and indium-tin-oxide(In2O3:Sn) thin films

被引：28

作者：

Mailis, S

Boutsikaris, L

Vainos, NA

Xirouhaki, C

Vasiliou, G

Garawal, N

Kiriakidis, G

Fritzsche, H

机构：

[1] FDN RES & TECHNOL HELLAS,INST ELECT STRUCT & LASER,MAT GRP,IRAKLION 71110,GREECE

[2] UNIV CHICAGO,JAMES FRANCK INST,CHICAGO,IL 60637

来源：

APPLIED PHYSICS LETTERS | 1996年 / 69卷 / 17期

关键词：

D O I：

10.1063/1.117497

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Holographic recording in polycrystalline indium-oxide (InOx) and indium-tin-oxide (ITO) thin films, grown by de magnetron sputtering, is demonstrated. This recording, performed at relatively low optical power levels in the ultraviolet (UV) wavelength range (325 nm), exhibits very large coupling strength and a slow but dynamic behavior. The observed phenomena are attributed to localized photorefractive effects and appear to be independent of the electrical characteristics of the films. (C) 1996 American Institute of Physics.

引用

页码：2459 / 2461

页数：3

共 6 条

[1] ELECTRICAL AND OPTICAL-PROPERTIES OF AMORPHOUS INDIUM OXIDE [J].