A surface motor-driven planar motion stage integrated with an XY0z surface encoder for precision positioning

被引:116
作者
Gao, W [1 ]
Dejima, S
Yanai, H
Katakura, K
Kiyono, S
Tomita, Y
机构
[1] Tohoku Univ, Dept Mech & Precis Engn, Sendai, Miyagi 9808579, Japan
[2] Sumitomo Heavy Ind Ltd, Tokyo, Japan
来源
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY | 2004年 / 28卷 / 03期
关键词
precision positioning; planar motion stage; surface motor; surface encoder;
D O I
10.1016/j.precisioneng.2003.12.003
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper describes a surface motor-driven XY planar motion stage equipped with a newly developed XYthetaZ surface encoder for sub-micron positioning. The surface motor consists of four linear motors placed on the same surface, two pairs in the XY-axes. The magnetic array and the stator winding of the linear motor are mounted on the platen (the moving element) and the stage base, respectively. The platen can be moved in the X-direction by the X-linear motors, and in the Y-direction by the Y-linear motors. It can also be rotated about the Z-axis if the X- or Y-linear motors generate a moment about the Z-axis. The surface encoder consists of two two-dimensional angle sensors and an angle grid with two-dimensional sinusoidal waves on its surface. The angle grid is mounted on the platen of the stage which is levitated by air-bearings. The angle sensors and the air-bearing pads are fixed on the stage base so that the motion of the platen is not affected by the electronic cables and air hoses. The XY-positions and theta(Z) rotation of the platen can be obtained from the angle sensor outputs with resolutions of approximately 20 nm and 0.2", respectively. The surface encoder is placed inside the stage so that the stage system is very compact in size. Experimental results indicate that precision positioning can be carried out independently in X, Y and theta(Z) with resolutions of 200 nm and 1, respectively. (C) 2004 Elsevier Inc. All rights reserved.
引用
收藏
页码:329 / 337
页数:9
相关论文
共 31 条
[1]   APPLICATION OF A FAST TOOL SERVO FOR DIAMOND TURNING OF NONROTATIONALLY SYMMETRICAL SURFACES [J].
DOW, TA ;
MILLER, MH ;
FALTER, PJ .
PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 1991, 13 (04) :243-250
[2]   HIGH-ACCURACY PROFILE MEASUREMENT OF QUASI-CONICAL MIRROR SURFACES BY LASER AUTOCOLLIMATION [J].
ENNOS, AE ;
VIRDEE, MS .
PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 1982, 4 (01) :5-8
[3]   Construction and testing of a nanomachining instrument [J].
Gao, W ;
Hocken, RJ ;
Patten, JA ;
Lovingood, J ;
Lucca, DA .
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2000, 24 (04) :320-328
[4]   Precision nano-fabrication and evaluation of a large area sinusoidal grid surface for a surface encoder [J].
Gao, W ;
Araki, T ;
Kiyono, S ;
Okazaki, Y ;
Yamanaka, M .
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2003, 27 (03) :289-298
[5]   Precision measurement of two-axis positions and tilt motions using a surface encoder [J].
Gao, W ;
Dejima, S ;
Shimizu, Y ;
Kiyono, S .
CIRP ANNALS-MANUFACTURING TECHNOLOGY, 2003, 52 (01) :435-438
[6]   Precision measurement of multi-degree-of-freedom spindle errors using two-dimensional slope sensors [J].
Gao, W ;
Kiyono, S ;
Satoh, E .
CIRP ANNALS-MANUFACTURING TECHNOLOGY, 2002, 51 (01) :447-450
[7]   Development of an optical probe for profile measurement of mirror surfaces [J].
Gao, W ;
Kiyono, S .
OPTICAL ENGINEERING, 1997, 36 (12) :3360-3366
[8]   A compact and sensitive two-dimensional angle probe for flatness measurement of large silicon wafers [J].
Gao, W ;
Huang, PSS ;
Yamada, T ;
Kiyono, S .
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2002, 26 (04) :396-404
[9]   Dynamics and control of the UNCC/MIT sub-atomic measuring machine [J].
Hocken, RJ ;
Trumper, DL ;
Wang, C .
CIRP ANNALS-MANUFACTURING TECHNOLOGY, 2001, 50 (01) :373-376
[10]   The long-range scanning stage: a novel platform for scanned-probe microscopy [J].
Holmes, M ;
Hocken, R ;
Trumper, D .
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2000, 24 (03) :191-209