Magnetic properties of thin Ni films measured by a dc SQUID-based magnetic microscope

被引：24

作者：

Snigirev, OV

Andreev, KE

Tishin, AM

Gudoshnikov, SA

Bohr, J

机构：

[1] RUSSIAN ACAD SCI,INST TERR MAGNETISM IONOSPHERE & RADIO WAVE P,TROITSK 142092,RUSSIA

[2] TECH UNIV DENMARK,DEPT PHYS,DK-2800 LYNGBY,DENMARK

来源：

PHYSICAL REVIEW B | 1997年 / 55卷 / 21期

关键词：

D O I：

10.1103/PhysRevB.55.14429

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have applied a scanning HTS (high-temperature superconductor) de SQUID (superconducting quantum interference device) -based magnetic microscope to study the magnetic properties of Au/Ni/Si(100) films in the thickness range from 8 to 200 Angstrom at T = 77 K. A one-domain structure with in-plane orientation of the magnetic moment was found for film thicknesses exceeding 26 Angstrom. A drastic decrease of the magnetization of the film was detected when the thickness is less than 26 Angstrom.

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页码：14429 / 14433

页数：5

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