Cryostat for in situ scanning tunneling microscopy studies of film growth at low temperatures

被引:9
作者
Ekinci, KL
Valles, JM
机构
[1] Department of Physics, Brown University, Providence
关键词
D O I
10.1063/1.1148360
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This article describes a low temperature scanning tunneling microscope (STM) system which is designed to study film growth at very low substrate temperatures (4 K < T-S<77 K). A simple tripod design with the addition of a sample manipulator, is implemented as the STM head. In this system, a metal film can be thermally deposited on a conducting or an insulating substrate held at cryogenic temperatures and be probed in situ by STM. In situ and room temperature images of a Pb film grown on a 4 K substrate are presented. (C) 1997 American Institute of Physics. [S0034-6748(97)01111-8].
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页码:4152 / 4154
页数:3
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