Direct observation of photoinduced charge redistribution of WO3-TiO2 double layer nanocomposite films by photoassisted Kelvin force microscopy

被引：20

作者：

Wang, S. J. ^{[1
]}

Cheng, G. ^{[1
]}

Jiang, X. H. ^{[1
]}

Li, Y. C. ^{[1
]}

Huang, Y. B. ^{[1
]}

Du, Z. L. ^{[1
]}

机构：

[1] Henan Univ, Key Lab Special Funct Mat, Kaifeng 475001, Peoples R China

来源：

APPLIED PHYSICS LETTERS | 2006年 / 88卷 / 21期

基金：

中国国家自然科学基金;

关键词：

D O I：

10.1063/1.2207498

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The microscopic photoinduced charge redistribution between heterogeneous semiconductor nanofilms of WO3 and TiO2 double layers (written as WO3-TiO2 nanocomposite films) was directly observed using Kelvin probe force microscopy (KFM) coupled with an UV light source. Under illumination the surface potential morphologies of WO3-TiO2 nanocomposite films changed from 162 to 592 mV, which was associated with the photoinduced charge transfer between WO3 and TiO2 nanoparticles due to the energy level alignment between them. This improved technique of photoassisted KFM was presented to visualize the photoinduced charge transfer between different semiconductor nanoparticles on microscopic scale. (c) 2006 American Institute of Physics.

引用

页数：3

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