Hierarchical design and test of integrated microsystems

被引：28

作者：

Mukherjee, T

Fedder, GK

Blanton, RDS ^{[1
]}

机构：

[1] Carnegie Mellon Univ, Dept Elect & Comp Engn, Ctr Electron Design Automat, Pittsburgh, PA 15213 USA

[2] Carnegie Mellon Univ, Inst Robot, Pittsburgh, PA 15213 USA

来源：

IEEE DESIGN & TEST OF COMPUTERS | 1999年 / 16卷 / 04期

关键词：

D O I：

10.1109/54.808200

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Successful design of application-specific integrated microchips that can sense and actuate as well as compute and communicate requires hierarchical design methodologies and tools such as those presented here.

引用

页码：18 / 27

页数：10

共 11 条

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