Refractive-index measurement based on the effects of total internal reflection and the uses of heterodyne interferometry

被引：65

作者：

Chiu, MH

Lee, JY

Su, DC

机构：

[1] Institute of Electro-Optical Engineering, National Chiao Tung University, Hsinchu, 30050

来源：

APPLIED OPTICS | 1997年 / 36卷 / 13期

关键词：

D O I：

10.1364/AO.36.002936

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A new method for measuring the refractive index is presented, First, the phase difference between s and p polarizations that is due to the total internal reflection is measured by heterodyne interferometry. Then, substituting this phase difference into the Fresnel equations, we can obtain the refractive index of the test medium. (C) 1997 Optical Society of America.

引用

页码：2936 / 2939

页数：4

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