SIMPLE AND DIRECT DETERMINATION OF COMPLEX REFRACTIVE-INDEX AND THICKNESS OF UNSUPPORTED OR EMBEDDED THIN-FILMS BY COMBINED REFLECTION AND TRANSMISSION ELLIPSOMETRY AT 45-DEGREES ANGLE OF INCIDENCE

被引：25

作者：

AZZAM, RMA

机构：

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1983年 / 73卷 / 08期

关键词：

D O I：

10.1364/JOSA.73.001080

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：1080 / 1082

页数：3

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