Highly ordered graphene for two dimensional electronics

被引:285
作者
Hass, J. [1 ]
Feng, R.
Li, T.
Li, X.
Zong, Z.
de Heer, W. A.
First, P. N.
Conrad, E. H.
Jeffrey, C. A.
Berger, C.
机构
[1] Georgia Inst Technol, Atlanta, GA 30332 USA
[2] Univ Missouri, Dept Phys & Astron, Columbia, MO 65211 USA
[3] CNRS, LEPES, F-38042 Grenoble, France
基金
加拿大自然科学与工程研究理事会; 美国国家科学基金会;
关键词
D O I
10.1063/1.2358299
中图分类号
O59 [应用物理学];
学科分类号
摘要
With expanding interest in graphene-based electronics, it is crucial that high quality graphene films be grown. Sublimation of Si from the 4H-SiC(0001) (Si-terminated) surface in ultrahigh vacuum is a demonstrated method to produce epitaxial graphene sheets on a semiconductor. In this letter the authors show that graphene grown from the SiC(000 (1) over bar) (C-terminated) surface are of higher quality than those previously grown on SiC(0001). Graphene grown on the C face can have structural domain sizes more than three times larger than those grown on the Si face while at the same time reducing SiC substrate disorder from sublimation by an order of magnitude. (c) 2006 American Institute of Physics.
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