Chemically resolved electrical measurements using x-ray photoelectron spectroscopy

被引：68

作者：

Cohen, H ^{[1
]}

机构：

[1] Weizmann Inst Sci, IL-76100 Rehovot, Israel

来源：

APPLIED PHYSICS LETTERS | 2004年 / 85卷 / 07期

关键词：

D O I：

10.1063/1.1782261

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Noncontact chemically resolved electrical measurements are presented, capable of probing selected regions within fine heterostructures. Using a slightly modified x-ray photoelectron spectrometer, an effective means is demonstrated for measuring I-V curves of molecular layers, free of substrate and contact contributions. The concept is simple and general, revealing unique details on electrical response mechanisms. Realized with commonly available equipment, it should be effective for a broad range of heterostructured systems. (C) 2004 American Institute of Physics.

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页码：1271 / 1273

页数：3

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