Observation of the surface stress induced in microcantilevers by electrochemical redox processes

被引：31

作者：

Tian, F ^{[1
]}

Pei, JH ^{[1
]}

Hedden, DL ^{[1
]}

Brown, GM ^{[1
]}

Thundat, T ^{[1
]}

机构：

[1] Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA

来源：

ULTRAMICROSCOPY | 2004年 / 100卷 / 3-4期

关键词：

surface stress; microcantilever; deflection; electrochemical potential;

D O I：

10.1016/j.ultramic.2003.12.012

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The potential-induced surface stress of a solid electrode was investigated in an electrochemical cell. Gold-coated atomic force microscopy microcantilevers were used as working electrodes to measure the current-potential response (by cyclic voltammetry) and simultaneous bending characteristics in solutions of NaNO3 and K3Fe(CN)(6)/NaNO3. The observed changes of differential surface stress at a microcantilever electrode were attributed to electrochemical-potential-induced changes in surface charge density, ion adsorption/desorption, and electron transfer across the electrode surface. The potential dependent change in stress shows promise for the study of microscopic properties at the solid-electrolyte interface. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：217 / 223

页数：7

共 18 条

[11] ABOUT THE MEASUREMENT OF ABSOLUTE ISOTROPIC SURFACE STRESS OF CRYSTALS [J].