Measurement of the stationary thermal nonlinear refraction light wave-front distortions by image processing

被引：6

作者：

Marcano, A ^{[1
]}

Escalona, R ^{[1
]}

机构：

[1] UNIV SIMON BOLIVAR, DEPT FIS, CARACAS 1080A, VENEZUELA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1997年 / 68卷 / 04期

关键词：

D O I：

10.1063/1.1147972

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The thermal stationary nonlinear refraction is determined with enhanced sensitivity by measuring the profile distortions of a cw probe light beam in the presence of absorption of a collinearly propagating pump light beam. By measuring the total profile distortion of the probe beam for different position of the sample cell, a signal similar to the well-known Z-scan signal is obtained. Using the Gaussian decomposition method a simple formula is deduced which relates the induced thermal phase shift to the magnitude of the observed signal. Phase shifts as low as lambda/40000 with a signal-to-noise ratio of unity becomes detectable with this technique. (C) 1997 American Institute of Physics.

引用

页码：1652 / 1656

页数：5

共 12 条

[1]

BRIDGES RE, 1995, OPT LETT, V20, P1821, DOI 10.1364/OL.20.001821

[2] Z-SCAN STUDIES OF NONLINEAR ABSORPTION AND REFRACTION IN BULK, UNDOPED INP [J].

DVORAK, MD ;

JUSTUS, BL .

OPTICS COMMUNICATIONS, 1995, 114 (1-2) :147-150

[3] DETERMINATION OF REAL AND IMAGINARY PART OF CHI((3)) OF THIOPHENE OLIGOMERS USING THE Z-SCAN TECHNIQUE [J].

HEIN, J ;

BERGNER, H ;

LENZNER, M ;

RENTSCH, S .

CHEMICAL PHYSICS, 1994, 179 (03) :543-548

[4] Sensitivity of the total beam profile distortion Z-scan for the measurement of nonlinear refraction [J].

Hernandez, FE ;

Marcano, A ;

Maillotte, H .

OPTICS COMMUNICATIONS, 1997, 134 (1-6) :529-536

[5] A MODEL FOR CW LASER-INDUCED MODE-MISMATCHED DUAL-BEAM THERMAL LENS SPECTROMETRY [J].

JUN, S ;

LOWE, RD ;

SNOOK, RD .

CHEMICAL PHYSICS, 1992, 165 (2-3) :385-396

[6] DUAL-BEAM TIME-RESOLVED Z-SCAN IN LIQUIDS TO STUDY HEATING DUE TO LINEAR AND NONLINEAR LIGHT-ABSORPTION [J].

KOZICH, VP ;

MARCANO, A ;

HERNANDEZ, FE ;

CASTILLO, JA .

APPLIED SPECTROSCOPY, 1994, 48 (12) :1506-1512

[7] 2-COLOR Z-SCAN TECHNIQUE WITH ENHANCED SENSITIVITY [J].

MA, H ;

DEARAUJO, CB .

APPLIED PHYSICS LETTERS, 1995, 66 (13) :1581-1583

[8] Picosecond nonlinear refraction measurement in single-beam open Z scan by charge-coupled device image processing [J].

Marcano, AO ;

Maillotte, H ;

Gindre, D ;

Metin, D .

OPTICS LETTERS, 1996, 21 (02) :101-103

[9] SENSITIVE MEASUREMENT OF OPTICAL NONLINEARITIES USING A SINGLE BEAM [J].

SHEIKBAHAE, M ;

SAID, AA ;

WEI, TH ;

HAGAN, DJ ;

VANSTRYLAND, EW .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 1990, 26 (04) :760-769

[10] MODEL FOR CW LASER-INDUCED MODE-MISMATCHED DUAL-BEAM THERMAL LENS SPECTROMETRY BASED ON PROBE BEAM PROFILE IMAGE DETECTION [J].

SHEN, J ;

SOROKA, AJ ;

SNOOK, RD .

JOURNAL OF APPLIED PHYSICS, 1995, 78 (02) :700-708

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