Effects of polishing and etching on TlBr single crystals

被引：21

作者：

Kozlov, V

Leskelä, M

Kemell, M

Sipilä, H

机构：

[1] Univ Helsinki, Dept Chem, FIN-00014 Helsinki, Finland

[2] Oxford Instruments Analyt Oy, FIN-02631 Espoo, Finland

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2006年 / 563卷 / 01期

关键词：

X-ray detector; TlBr;

D O I：

10.1016/j.nima.2006.01.065

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The single crystal TlBr, a promising candidate as a room temperature gamma-ray detector has material problems that are related to purity, crystal quality and treatment during the detector manufacturing. In this work, the effects of sizing, polishing and etching on properties of TlBr were studied by field emission scanning electron microscope and by the X-ray diffraction rocking curve method. The hydrothermal and thermal annealings were used as the etch methods. The properly polished sample was characterized by current-voltage, capacitance and photocurrent measurements in the range 7-37 degrees C. (c) 2006 Elsevier B.V. All rights reserved.

引用

页码：58 / 61

页数：4

共 8 条

[1] CHEMICAL AND THERMAL ETCHING OF TELLURIUM SINGLE CRYSTALS [J].