Subwavelength infrared spectromicroscopy using an AFM as a local absorption sensor

被引:70
作者
Dazzi, A. [1 ]
Prazeres, R. [1 ]
Glotin, F. [1 ]
Ortega, J. M. [1 ]
机构
[1] Univ Paris 11, LURE, CLIO, F-91898 Orsay, France
关键词
microscopy; spectroscopy; nanoscience;
D O I
10.1016/j.infrared.2006.01.009
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We describe a new method of infrared micro-spectroscopy. It aims at performing "chemical mapping" of various objects with sub-wavelength lateral resolution, by using the infrared oscillatory signature characterizing different molecular species. Here, we use an atomic force microscope tip, probing the local transient deformation induced by an infrared-pulsed laser tuned at sample absorbing wavelength of the sample. The tip oscillates at resonant frequencies, which amplitude can be correlated with local absorption. We show that this new tool opens the way of measuring and identifying spectroscopic contrasts not accessible by far-field or near-field optical methods and with a sub-wavelength lateral resolution that is not limited by the heat flow through the sample. We exemplify the accuracy of the method by mapping Escherichia coli bacteria at different wavelengths. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:113 / 121
页数:9
相关论文
共 17 条
[1]   NEAR-FIELD OPTICAL MICROSCOPE BASED ON LOCAL PERTURBATION OF A DIFFRACTION SPOT [J].
BACHELOT, R ;
GLEYZES, P ;
BOCCARA, AC .
OPTICS LETTERS, 1995, 20 (18) :1924-1926
[2]   PHOTOTHERMAL MEASUREMENT OF THE THERMAL-CONDUCTIVITY OF SUPERCOOLED WATER [J].
BENCHIKH, O ;
FOURNIER, D ;
BOCCARA, AC ;
TEIXEIRA, J .
JOURNAL DE PHYSIQUE, 1985, 46 (05) :727-731
[3]   Free-electron-laser near-field nanospectroscopy [J].
Cricenti, A ;
Generosi, R ;
Perfetti, P ;
Gilligan, JM ;
Tolk, NH ;
Coluzza, C ;
Margaritondo, G .
APPLIED PHYSICS LETTERS, 1998, 73 (02) :151-153
[4]   Local infrared microspectroscopy with subwavelength spatial resolution with an atomic force microscope tip used as a photothermal sensor [J].
Dazzi, A ;
Prazeres, R ;
Glotin, E ;
Ortega, JM .
OPTICS LETTERS, 2005, 30 (18) :2388-2390
[5]   Theoretical study of an absorbing sample in infrared near-field spectromicroscopy [J].
Dazzi, A ;
Goumri-Said, S ;
Salomon, L .
OPTICS COMMUNICATIONS, 2004, 235 (4-6) :351-360
[6]   Enhancing the lateral resolution in infrared microspectrometry by using synchrotron radiation: applications and perspectives [J].
Dumas, P ;
Carr, GL ;
Williams, GP .
ANALUSIS, 2000, 28 (01) :68-74
[7]   Infrared near-field study of a localised absorption in a thin film [J].
Gross, N ;
Dazzi, A ;
Ortega, JM ;
Andouart, R ;
Prazeres, R ;
Chicanne, C ;
Goudonnet, JP ;
Lacroute, Y ;
Boussard, C ;
Fonteneau, G ;
Hocdé, S .
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 2001, 16 (02) :91-98
[8]   Synchrotron infrared microspectrometry applied to petrography in micrometer-scale range: Fluid chemical analysis and mapping [J].
Guilhaumou, N ;
Dumas, P ;
Carr, GL ;
Williams, GP .
APPLIED SPECTROSCOPY, 1998, 52 (08) :1029-1034
[9]   Imaging single living cells with a scanning near-field infrared microscope based on a free electron laser [J].
Hong, MK ;
Jeung, AG ;
Dokholyan, NV ;
Smith, TI ;
Schwettman, HA ;
Huie, P ;
Erramilli, S .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1998, 144 (1-4) :246-255
[10]   Near-field probing of vibrational absorption for chemical microscopy [J].
Knoll, B ;
Keilmann, F .
NATURE, 1999, 399 (6732) :134-137