Free-electron-laser near-field nanospectroscopy

被引：39

作者：

Cricenti, A

Generosi, R

Perfetti, P

Gilligan, JM

Tolk, NH

Coluzza, C

Margaritondo, G

机构：

[1] CNR, Ist Stuttura Mat, I-00133 Rome, Italy

[2] Vanderbilt Univ, Dept Phys & Astron, Nashville, TN 37235 USA

[3] Univ Rome La Sapienza, Dipartimento Fis, I-00185 Rome, Italy

[4] Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland

来源：

APPLIED PHYSICS LETTERS | 1998年 / 73卷 / 02期

关键词：

D O I：

10.1063/1.121739

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

First experiments at the Vanderbilt free electron lasers measured the local reflectivity of a PtSi/Si system. The reflectivity in the scanning near-field optical microscope images revealed features that were not present in the corresponding shear-force (topology) images and which were due to localized changes in the bulk properties of the sample. The size of the smallest detected features clearly demonstrated that near-field conditions were reached. The use of different photon wavelengths (0.653, 1.2, and 2.4 mu m) enabled us to probe regions of different depth. (C) 1998 American Institute of Physics.

引用

页码：151 / 153

页数：3

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