Reverse engineering by fringe projection

被引：98

作者：

Burke, J ^{[1
]}

Bothe, T ^{[1
]}

Osten, W ^{[1
]}

Hess, C ^{[1
]}

机构：

[1] MetroLaser Inc, Irvine, CA 92614 USA

来源：

INTERFEROMETRY XI: APPLICATIONS | 2002年 / 4778卷

关键词：

fringe projection; phase unwrapping; photogrammetry; reverse engineering;

D O I：

10.1117/12.473547

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We report on the development of a versatile and portable optical profilometer and show its applicability for quick and accurate digitization of 3-D objects. The profilometer is an advanced fringe-projection system that uses a calibrated LCD matrix for fringe-pattern generation, a "hierarchical" sequence of fringe patterns to demodulate the measured phase, and a photogrammetric calibration technique to obtain accurate 3-D data in the measurement volume. The setup in itself is mechanically stable and allows for a measurement volume of about 1x1x0.5 m(3). We discuss the calibration of the sensor and demonstrate the process of recording phase data for several sub-views, generating 3-D "point clouds" from them, and synthesizing the CAD representation of an entire 3-D object by merging the data sets.

引用

页码：312 / 324

页数：13

共 31 条

[21] Additive noise effect in digital phase detection [J].