Raman microscopy analysis of phase transformation mechanisms in vanadium dioxide

被引:163
作者
Petrov, GI [1 ]
Yakovlev, VV
Squier, J
机构
[1] Univ Wisconsin, Dept Phys, Milwaukee, WI 53211 USA
[2] Univ Calif San Diego, Dept Elect Engn, La Jolla, CA 92093 USA
关键词
D O I
10.1063/1.1496506
中图分类号
O59 [应用物理学];
学科分类号
摘要
Raman microscopy is used to study the evolution of vibrational modes of vanadium dioxide single crystals and thin films in the vicinity of the phase transition. The results support the electron correlation model of phase transformation. (C) 2002 American Institute of Physics.
引用
收藏
页码:1023 / 1025
页数:3
相关论文
共 35 条
[1]   INFRARED OPTICAL PROPERTIES OF VANADIUM DIOXIDE ABOVE AND BELOW TRANSITION TEMPERATURE [J].
BARKER, AS ;
VERLEUR, HW ;
GUGGENHEIM, HJ .
PHYSICAL REVIEW LETTERS, 1966, 17 (26) :1286-+
[2]   FEMTOSECOND LASER EXCITATION OF THE SEMICONDUCTOR-METAL PHASE-TRANSITION IN VO2 [J].
BECKER, MF ;
BUCKMAN, AB ;
WALSER, RM ;
LEPINE, T ;
GEORGES, P ;
BRUN, A .
APPLIED PHYSICS LETTERS, 1994, 65 (12) :1507-1509
[3]   Femtosecond laser excitation dynamics of the semiconductor-metal phase transition in VO2 [J].
Becker, MF ;
Buckman, AB ;
Walser, RM ;
Lepine, T ;
Georges, P ;
Brun, A .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (05) :2404-2408
[4]   Time-resolved characteristics of phase conjugation in metal-semiconductor phase transition in VO2 [J].
Berger, NK ;
Shuker, R .
APPLIED PHYSICS LETTERS, 1999, 74 (19) :2770-2772
[5]   Microstructure and metal-insulating transition of VO2 thin films [J].
Béteille, F ;
Mazerolles, L ;
Livage, J .
MATERIALS RESEARCH BULLETIN, 1999, 34 (14-15) :2177-2184
[6]   PULSED-LASER DEPOSITION OF ORIENTED VO2 THIN-FILMS ON R-CUT SAPPHIRE SUBSTRATES [J].
BOREK, M ;
QIAN, F ;
NAGABUSHNAM, V ;
SINGH, RK .
APPLIED PHYSICS LETTERS, 1993, 63 (24) :3288-3290
[7]   SYMMETRY CONSIDERATIONS AND VANADIUM DIOXIDE PHASE TRANSITION [J].
BREWS, JR .
PHYSICAL REVIEW B, 1970, 1 (06) :2557-&
[8]   IMPROVED VO2 THIN-FILMS FOR INFRARED SWITCHING [J].
CASE, FC .
APPLIED OPTICS, 1991, 30 (28) :4119-4123
[9]   Femtosecond structural dynamics in VO2 during an ultrafast solid-solid phase transition -: art. no. 237401 [J].
Cavalleri, A ;
Tóth, C ;
Siders, CW ;
Squier, JA ;
Ráksi, F ;
Forget, P ;
Kieffer, JC .
PHYSICAL REVIEW LETTERS, 2001, 87 (23) :237401-1
[10]   Thermal dynamics of VO2 films within the metal-insulator transition:: Evidence for chaos near percolation threshold [J].
de Almeida, LAL ;
Deep, GS ;
Lima, AMN ;
Neff, H .
APPLIED PHYSICS LETTERS, 2000, 77 (26) :4365-4367