Room-temperature-operating data processing circuit based on single-electron transfer and detection with metal-oxide-semiconductor field-effect transistor technology

被引:50
作者
Nishiguchi, K [1 ]
Fujiwara, A [1 ]
Ono, Y [1 ]
Inokawa, H [1 ]
Takahashi, Y [1 ]
机构
[1] NTT Corp, NTT Basic Res Labs, Kanagawa 2430198, Japan
关键词
D O I
10.1063/1.2200475
中图分类号
O59 [应用物理学];
学科分类号
摘要
A single-electron-based circuit, in which electrons are transferred one by one with a turnstile and subsequently detected with a high-charge-sensitivity electrometer, was fabricated on a silicon-on-insulator substrate. The turnstile, which is operated by opening and closing two metal-oxide-semiconductor field-effect transistors alternately, allows single-electron transfer at room temperature owing to electric-field-assisted shrinkage of the single-electron box. It also achieves fast single-electron transfer (less than 10 ns) and extremely long retention (more than 10(4) s). We have applied these features to a multilevel memory and a time-division weighted sum circuit for a digital-to-analog converter. (c) 2006 American Institute of Physics.
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页数:3
相关论文
共 16 条
[1]   Amplifying quantum signals with the single-electron transistor [J].
Devoret, MH ;
Schoelkopf, RJ .
NATURE, 2000, 406 (6799) :1039-1046
[2]   Current quantization due to single-electron transfer in Si-wire charge-coupled devices [J].
Fujiwara, A ;
Zimmerman, NM ;
Ono, Y ;
Takahashi, Y .
APPLIED PHYSICS LETTERS, 2004, 84 (08) :1323-1325
[3]   Manipulation of elementary charge in a silicon charge-coupled device [J].
Fujiwara, A ;
Takahashi, Y .
NATURE, 2001, 410 (6828) :560-562
[4]   OBSERVATION OF SINGLE-ELECTRON CHARGING EFFECTS IN SMALL TUNNEL-JUNCTIONS [J].
FULTON, TA ;
DOLAN, GJ .
PHYSICAL REVIEW LETTERS, 1987, 59 (01) :109-112
[5]   Analysis of back-gate voltage dependence of threshold voltage of thin silicon-on-insulator metal-oxide-semiconductor field-effect transistor and its application to Si single-electron transistor [J].
Horiguchi, S ;
Fujiwara, A ;
Inokawa, H ;
Takahashi, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2004, 43 (4B) :2036-2040
[6]   A multiple-valued logic and memory with combined single-electron and metal-oxide-semiconductor transistors [J].
Inokawa, H ;
Fujiwara, A ;
Takahashi, Y .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2003, 50 (02) :462-470
[7]   BISTABLE SATURATION IN COUPLED QUANTUM DOTS FOR QUANTUM CELLULAR AUTOMATA [J].
LENT, CS ;
TOUGAW, PD ;
POROD, W .
APPLIED PHYSICS LETTERS, 1993, 62 (07) :714-716
[8]   Single-electron devices and their applications [J].
Likharev, KK .
PROCEEDINGS OF THE IEEE, 1999, 87 (04) :606-632
[9]   CRYOGENIC FIELD-EFFECT TRANSISTOR WITH SINGLE ELECTRONIC CHARGE SENSITIVITY [J].
MAR, DJ ;
WESTERVELT, RM ;
HOPKINS, PF .
APPLIED PHYSICS LETTERS, 1994, 64 (05) :631-633
[10]  
Meriav U., 1995, SEMICOND SCI TECH, V10, P255