Diffraction-based solid immersion lens

被引:40
作者
Brunner, R
Burkhardt, M
Pesch, A
Sandfuchs, O
Ferstl, M
Hohng, S
White, JO
机构
[1] Carl Zeiss Jena GmbH, D-07745 Jena, Germany
[2] Heinrich Hertz Inst Nachrichtentech Berlin GmbH, Fraunhofer Inst Telecommun, D-10587 Berlin, Germany
[3] Univ Illinois, Frederick Seitz Mat Res Lab, Urbana, IL 61801 USA
关键词
D O I
10.1364/JOSAA.21.001186
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A solid immersion lens based on diffraction (dSIL) is proposed as an alternative to the conventional design based on refraction. A design analogous to a Fresnel zone plate is derived in accordance with the Huygens-Fresnel principle. Fabrication of a binary dSIL is achieved by electron-beam lithography and reactive-ion etching on LaSF35, with index n = 2.014. Measurement of the point-spread function is performed with near-field optical microscopy. The results are in accord with the expected resolution enhancement of a factor n with respect to the diffraction limit. (C) 2004 Optical Society of America.
引用
收藏
页码:1186 / 1191
页数:6
相关论文
共 9 条
[1]   Aberrations and allowances for errors in a hemisphere solid immersion lens for submicron-resolution photoluminescence microscopy [J].
Baba, M ;
Sasaki, T ;
Yoshita, M ;
Akiyama, H .
JOURNAL OF APPLIED PHYSICS, 1999, 85 (09) :6923-6925
[2]  
BISCHOFF J, 2001, THESIS ILMENAU TU IL
[3]   High collection efficiency in fluorescence microscopy with a solid immersion lens [J].
Koyama, K ;
Yoshita, M ;
Baba, M ;
Suemoto, T ;
Akiyama, H .
APPLIED PHYSICS LETTERS, 1999, 75 (12) :1667-1669
[4]   Use of Fourier series in the analysis of discontinuous periodic structures [J].
Li, LF .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1996, 13 (09) :1870-1876
[5]   SOLID IMMERSION MICROSCOPE [J].
MANSFIELD, SM ;
KINO, GS .
APPLIED PHYSICS LETTERS, 1990, 57 (24) :2615-2616
[6]   Chromatic correction of high-performance solid immersion lens systems [J].
Milster, TD .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (3B) :1777-1779
[7]   DIFFRACTION ANALYSIS OF DIELECTRIC SURFACE-RELIEF GRATINGS [J].
MOHARAM, MG ;
GAYLORD, TK .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1982, 72 (10) :1385-1392
[8]   Raman imaging of patterned silicon using a solid immersion lens [J].
Poweleit, CD ;
Gunther, A ;
Goodnick, S ;
Menendez, J .
APPLIED PHYSICS LETTERS, 1998, 73 (16) :2275-2277
[9]   Realization of numerical aperture 2.0 using a gallium phosphide solid immersion lens [J].
Wu, Q ;
Feke, GD ;
Grober, RD ;
Ghislain, LP .
APPLIED PHYSICS LETTERS, 1999, 75 (26) :4064-4066