The implications of spontaneous polarization effects for carrier transport measurements in GaN

被引:22
作者
Harris, JJ [1 ]
Lee, KJ
Webb, JB
Tang, H
Harrison, I
Flannery, LB
Cheng, TS
Foxon, CT
机构
[1] UCL, Dept Elect & Elect Engn, London WC1E 7JE, England
[2] Natl Res Council Canada, Microelect Res Grp, Ottawa, ON K1A 0R0, Canada
[3] Univ Nottingham, Sch Elect & Elect Engn, Nottingham NG7 2RD, England
[4] Univ Nottingham, Sch Phys & Astron, Nottingham NG7 2RD, England
关键词
D O I
10.1088/0268-1242/15/4/319
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In wurtzite-phase GaN, AIN and InN, the dimensions of the crystallographic unit cell are distorted from the ideal c:a ratio of root 8/3 This produces a net dipole moment across the cell, with a resultant internal electric field in excess of 1 MV cm(-1), and corresponding polarization charges of +/-3-8 x 10(-6) C cm(-2) on the two surfaces of the epitaxial layer. The effect of this field on the carrier distribution within a film of doped GaN is considered, and shown to produce accumulation and inversion layers of free carriers at opposite surfaces. Theoretical expressions are derived for the effective carrier density and mobility of such films obtained from Hall measurements, and compared with characteristic experimental results. Qualitatively consistent behaviour is observed in some, but not all, samples, but quantitative agreement is generally lacking, and possible explanations for this are considered.
引用
收藏
页码:413 / 417
页数:5
相关论文
共 10 条
  • [1] Piezoelectric charge densities in AlGaN/GaN HFETs
    Asbeck, PM
    Yu, ET
    Lau, SS
    Sullivan, GJ
    VanHove, J
    Redwing, J
    [J]. ELECTRONICS LETTERS, 1997, 33 (14) : 1230 - 1231
  • [2] Spontaneous polarization and piezoelectric constants of III-V nitrides
    Bernardini, F
    Fiorentini, V
    Vanderbilt, D
    [J]. PHYSICAL REVIEW B, 1997, 56 (16): : 10024 - 10027
  • [3] Free-carrier screening of polarization fields in wurtzite GaN/InGaN laser structures
    Della Sala, F
    Di Carlo, A
    Lugli, P
    Bernardini, F
    Fiorentini, V
    Scholz, R
    Jancu, JM
    [J]. APPLIED PHYSICS LETTERS, 1999, 74 (14) : 2002 - 2004
  • [4] Harris JJ, 1999, PHYS STATUS SOLIDI A, V176, P363, DOI 10.1002/(SICI)1521-396X(199911)176:1<363::AID-PSSA363>3.0.CO
  • [5] 2-M
  • [6] PARALLEL CONDUCTION IN GAAS/ALXGA1-XAS MODULATION DOPED HETEROJUNCTIONS
    KANE, MJ
    APSLEY, N
    ANDERSON, DA
    TAYLOR, LL
    KERR, T
    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1985, 18 (29): : 5629 - 5636
  • [7] Lattice parameters of gallium nitride
    Leszczynski, M
    Teisseyre, H
    Suski, T
    Grzegory, I
    Bockowski, M
    Jun, J
    Porowski, S
    Pakula, K
    Baranowski, JM
    Foxon, CT
    Cheng, TS
    [J]. APPLIED PHYSICS LETTERS, 1996, 69 (01) : 73 - 75
  • [8] Degenerate layer at GaN/sapphire interface: Influence on hall-effect measurements
    Look, DC
    Molnar, RJ
    [J]. APPLIED PHYSICS LETTERS, 1997, 70 (25) : 3377 - 3379
  • [9] ELECTRON-TRANSPORT MECHANISM IN GALLIUM NITRIDE
    MOLNAR, RJ
    LEI, T
    MOUSTAKAS, TD
    [J]. APPLIED PHYSICS LETTERS, 1993, 62 (01) : 72 - 74
  • [10] THEORY OF AN EXPERIMENT FOR MEASURING THE MOBILITY AND DENSITY OF CARRIERS IN THE SPACE-CHARGE REGION OF A SEMICONDUCTOR SURFACE
    PETRITZ, RL
    [J]. PHYSICAL REVIEW, 1958, 110 (06): : 1254 - 1262