Interfacial melting of ice in contact with SiO2 -: art. no. 205701

被引：168

作者：

Engemann, S

Reichert, H

Dosch, H

Bilgram, J

Honkimäki, V

Snigirev, A

机构：

[1] Max Planck Inst Met Res, D-70569 Stuttgart, Germany

[2] Univ Stuttgart, Inst Theoret & Angew Phys, D-70569 Stuttgart, Germany

[3] Swiss Fed Inst Technol, Festkorperphys Lab, CH-8093 Zurich, Switzerland

[4] European Synchrotron Radiat Facil, F-38043 Grenoble, France

来源：

PHYSICAL REVIEW LETTERS | 2004年 / 92卷 / 20期

关键词：

D O I：

10.1103/PhysRevLett.92.205701

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The physical behavior of condensed matter can be drastically altered in the presence of interfaces. Using a high-energy x-ray transmission-reflection scheme, we have studied ice-SiO2 model interfaces. We observed the formation of a quasiliquid layer below the bulk melting temperature and determined its thickness and density as a function of temperature. The quasiliquid layer has stronger correlations than water and a large density close to rho(HDA)=1.17 g/cm(3) of high-density amorphous ice suggesting a structural relationship with the postulated high-density liquid phase of water.

引用

页码：205701 / 1

页数：4

共 28 条

[1]

[Anonymous], 1988, CHEM PHYS SOLID SURF

[2] EXTRINSIC PREMELTING AT THE ICE GLASS INTERFACE [J].