Normal and lateral force investigation using magnetically activated force sensors

被引：20

作者：

Jarvis, SP

Yamada, H

Kobayashi, K

Toda, A

Tokumoto, H

机构：

[1] NAIR, Joint Res Ctr Atom Technol, Tsukuba, Ibaraki 3050046, Japan

[2] Kyoto Univ, Dept Elect Sci & Engn, Sakyo Ku, Kyoto 60601, Japan

[3] Olympus Opt, Hachioji, Tokyo 1928507, Japan

来源：

APPLIED SURFACE SCIENCE | 2000年 / 157卷 / 04期

关键词：

force spectroscopy; dynamic lateral force microscopy; magnetic force control; tip-surface interaction;

D O I：

10.1016/S0169-4332(99)00545-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A new design of cantilever has been fabricated in order to easily apply the resonance dynamic measurement technique to lateral interactions between an atomic force microscope tip and sample. Simultaneous images have been obtained in ultrahigh vacuum (UHV) for normal and lateral interactions by activating the cantilever independently at its normal and lateral resonant frequency. The distance dependence of the normal and lateral tip-sample interactions have also been investigated. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

收藏

页码：314 / 319

页数：6

相关论文

共 15 条

[1] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].

ALBRECHT, TR ;

GRUTTER, P ;

HORNE, D ;

RUGAR, D .

JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673

[2] Independent detection of vertical and lateral forces with a sidewall-implanted dual-axis piezoresistive cantilever [J].

Chui, BW ;

Kenny, TW ;

Mamin, HJ ;

Terris, BD ;

Rugar, D .

APPLIED PHYSICS LETTERS, 1998, 72 (11) :1388-1390

[3] LOCAL ELECTRICAL DISSIPATION IMAGED BY SCANNING FORCE MICROSCOPY [J].

DENK, W ;

POHL, DW .

APPLIED PHYSICS LETTERS, 1991, 59 (17) :2171-2173

[4]

Durig U, 1997, J APPL PHYS, V82, P3641, DOI 10.1063/1.365726

[5] INTERACTION FORCE DETECTION IN SCANNING PROBE MICROSCOPY - METHODS AND APPLICATIONS [J].

DURIG, U ;

ZUGER, O ;

STALDER, A .

JOURNAL OF APPLIED PHYSICS, 1992, 72 (05) :1778-1798

[6] Inequivalent atoms and imaging mechanisms in ac-mode atomic-force microscopy of Si(111)7x7 [J].

Erlandsson, R ;

Olsson, L ;

Martensson, P .

PHYSICAL REVIEW B, 1996, 54 (12) :R8309-R8312

[7] ATOMIC-RESOLUTION OF THE SILICON (111)-(7X7) SURFACE BY ATOMIC-FORCE MICROSCOPY [J].

GIESSIBL, FJ .

SCIENCE, 1995, 267 (5194) :68-71

[8] Determination of tip-sample interaction forces from measured dynamic force spectroscopy curves [J].

Gotsmann, B ;

Anczykowski, B ;

Seidel, C ;

Fuchs, H .

APPLIED SURFACE SCIENCE, 1999, 140 (3-4) :314-319

[9] Alternative method for the activation and measurement of lateral forces using magnetically controlled atomic force microscopy [J].

Jarvis, SP ;

Tokumoto, H ;

Yamada, H ;

Kobayashi, K ;

Toda, A .

APPLIED PHYSICS LETTERS, 1999, 75 (24) :3883-3885

[10] A NOVEL FORCE MICROSCOPE AND POINT-CONTACT PROBE [J].

JARVIS, SP ;

ORAL, A ;

WEIHS, TP ;

PETHICA, JB .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (12) :3515-3520