Single event upset at ground level

被引：345

作者：

Normand, E

机构：

[1] IEEE Boeing Defense and Space Group, Seattle

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1996年 / 43卷 / 06期

关键词：

D O I：

10.1109/23.556861

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Ground level upsets have been observed in computer systems containing large amounts of random access memory (RAM). Atmospheric neutrons are most likely the major cause of the upsets based on measured data using the Weapons Neutron Research (WNR) neutron beam.

引用

页码：2742 / 2750

页数：9

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