High resolution structural and magnetic imaging

被引：1

作者：

Petford-Long, AK ^{[1
]}

Shang, P ^{[1
]}

机构：

[1] Univ Oxford, Dept Mat, Oxford OX1 3PH, England

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 2002年 / 242卷 / PART I期

关键词：

spin valves; interface structure; transmission electron microscope; magnetisation reversal;

D O I：

10.1016/S0304-8853(01)01183-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In order to make full use of novel magnetic materials such as layered information storage materials, it is important to understand their microstructure, composition profile and magnetic domain structure. Local inhomogeneities in these properties require analysis with high spatial resolution, and this paper describes the application of transmission electron microscope and three-dimensional atom probe microanalysis to the study of these materials. (C) 2002 Elsevier Science B.V. All rights reserved.

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页码：53 / 58

页数：6

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