Record number (11000) of interference fringes obtained by a 1 MV field-emission electron microscope

被引：13

作者：

Akashi, T ^{[1
]}

Harada, K

Matsuda, T

Kasai, H

Tonomura, A

Furutsu, T

Moriya, N

Yoshida, T

Kawasaki, T

Kitazawa, K

Koinuma, H

机构：

[1] Hitachi Instruments Serv Co Ltd, Tokyo 1600004, Japan

[2] JST, SORST, Tokyo 1030027, Japan

[3] Hitachi Ltd, Adv Res Lab, Hatoyama, Saitama 3500395, Japan

[4] Inst Phys & Chem Res, Wako, Saitama 3510198, Japan

[5] Hitachi High Technol Co, BTC, Naka Div, Hitachinaka 3128504, Japan

[6] Univ Tokyo, Dept Adv Mat Sci, Tokyo 1130033, Japan

[7] Tokyo Inst Technol, Dept Innovat & Engn Mat, Yokohama, Kanagawa 2268502, Japan

[8] JST, CREST, Kawaguchi 3320012, Japan

来源：

APPLIED PHYSICS LETTERS | 2002年 / 81卷 / 10期

关键词：

Biprism - Electron biprism - Interference fringe - Stray magnetic fields - World records;

D O I：

10.1063/1.1505115

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

An electron biprism for a 1 million-volt field-emission electron microscope was developed. This biprism is controlled similarly as a specimen holder so that it can be driven and rotated precisely and is tough against mechanical vibration and stray magnetic field. We recorded the maximum number of interference fringes by using this biprism in order to confirm the overall performance as a holography electron microscope, and obtained a world record of 11 000 interference fringes. (C) 2002 American Institute of Physics.

引用

页码：1922 / 1924

页数：3

共 8 条

[1] ELECTRON GUN USING A FIELD EMISSION SOURCE [J].