Dynamics of quartz tuning fork force sensors used in scanning probe microscopy

被引:91
作者
Castellanos-Gomez, A. [1 ]
Agrait, N. [1 ,2 ]
Rubio-Bollinger, G. [1 ]
机构
[1] Univ Autonoma Madrid, Dept Fis Mat Condensada, E-28049 Madrid, Spain
[2] Inst Madrileno Estudios Avanzados Nanociencia IMD, Madrid 28049, Spain
关键词
DISTANCE CONTROL; SPRING CONSTANT; CANTILEVERS; RESOLUTION; SURFACE; ATOM;
D O I
10.1088/0957-4484/20/21/215502
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We have performed an experimental characterization of the dynamics of oscillating quartz tuning forks which are being increasingly used in scanning probe microscopy as force sensors. We show that tuning forks can be described as a system of coupled oscillators. Nevertheless, this description requires knowledge of the elastic coupling constant between the prongs of the tuning fork, which has not yet been measured. Therefore, tuning forks have usually been described within the single oscillator or the weakly coupled oscillators approximation that neglects the coupling between the prongs. We propose three different procedures to measure the elastic coupling constant: an opto-mechanical method, a variation of the Cleveland method and a thermal noise based method. We find that the coupling between the quartz tuning fork prongs has a strong influence on the dynamics and the measured motion is in remarkable agreement with a simple model of coupled harmonic oscillators. The precise determination of the elastic coupling between the prongs of a tuning fork allows us to obtain a quantitative relation between the resonance frequency shift and the force gradient acting at the free end of a tuning fork prong.
引用
收藏
页数:8
相关论文
共 25 条
  • [1] Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy
    Albers, Boris J.
    Liebmann, Marcus
    Schwendemann, Todd C.
    Baykara, Mehmet Z.
    Heyde, Markus
    Salmeron, Miquel
    Altman, Eric I.
    Schwarz, Udo D.
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2008, 79 (03)
  • [2] CALCULATION OF THERMAL NOISE IN ATOMIC-FORCE MICROSCOPY
    BUTT, HJ
    JASCHKE, M
    [J]. NANOTECHNOLOGY, 1995, 6 (01) : 1 - 7
  • [3] A NONDESTRUCTIVE METHOD FOR DETERMINING THE SPRING CONSTANT OF CANTILEVERS FOR SCANNING FORCE MICROSCOPY
    CLEVELAND, JP
    MANNE, S
    BOCEK, D
    HANSMA, PK
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (02) : 403 - 405
  • [4] Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor
    Edwards, H
    Taylor, L
    Duncan, W
    Melmed, AJ
    [J]. JOURNAL OF APPLIED PHYSICS, 1997, 82 (03) : 980 - 984
  • [5] Subatomic features on the silicon (111)-(7x7) surface observed by atomic force microscopy
    Giessibl, FJ
    Hembacher, S
    Bielefeldt, H
    Mannhart, J
    [J]. SCIENCE, 2000, 289 (5478) : 422 - 425
  • [6] Atomic resolution on Si(111)-(7x7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork
    Giessibl, FJ
    [J]. APPLIED PHYSICS LETTERS, 2000, 76 (11) : 1470 - 1472
  • [7] High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork
    Giessibl, FJ
    [J]. APPLIED PHYSICS LETTERS, 1998, 73 (26) : 3956 - 3958
  • [8] A direct method to calculate tip-sample forces from frequency shifts in frequency-modulation atomic force microscopy
    Giessibl, FJ
    [J]. APPLIED PHYSICS LETTERS, 2001, 78 (01) : 123 - 125
  • [9] Fundamental limits to force detection using quartz tuning forks
    Grober, RD
    Acimovic, J
    Schuck, J
    Hessman, D
    Kindlemann, PJ
    Hespanha, J
    Morse, AS
    Karrai, K
    Tiemann, I
    Manus, S
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (07) : 2776 - 2780
  • [10] Force microscopy with light-atom probes
    Hembacher, S
    Giessibl, FJ
    Mannhart, J
    [J]. SCIENCE, 2004, 305 (5682) : 380 - 383