共 26 条
Effect of the growth temperature on ZnO thin films grown by plasma enhanced chemical vapor deposition
被引:30
作者:

Li, BS
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机构: Chinese Acad Sci, Open Lab Excited State Proc, Changchun 130021, Peoples R China

Liu, YC
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机构: Chinese Acad Sci, Open Lab Excited State Proc, Changchun 130021, Peoples R China

Zhi, ZZ
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机构: Chinese Acad Sci, Open Lab Excited State Proc, Changchun 130021, Peoples R China

Shen, DZ
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机构: Chinese Acad Sci, Open Lab Excited State Proc, Changchun 130021, Peoples R China

Lu, YM
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机构: Chinese Acad Sci, Open Lab Excited State Proc, Changchun 130021, Peoples R China

Zhang, JY
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机构: Chinese Acad Sci, Open Lab Excited State Proc, Changchun 130021, Peoples R China

Kong, XG
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机构: Chinese Acad Sci, Open Lab Excited State Proc, Changchun 130021, Peoples R China

Fan, XW
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机构: Chinese Acad Sci, Open Lab Excited State Proc, Changchun 130021, Peoples R China
机构:
[1] Chinese Acad Sci, Open Lab Excited State Proc, Changchun 130021, Peoples R China
[2] Chinese Acad Sci, Changchun Inst Opt Fine Mech & Phys, Changchun 130021, Peoples R China
基金:
中国国家自然科学基金;
关键词:
zinc oxide;
plasma processing and deposition;
luminescence;
organometallic vapor deposition;
D O I:
10.1016/S0040-6090(02)00491-1
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
A preferred oriented (0 0 2) ZnO thin films have been grown on Si (10 0) substrate via plasma enhanced chemical vapor deposition using diethylzinc and carbon dioxide as reactant sources. In this paper, the dependence of the quality of the ZnO thin film on the growth temperature is studied. A polycrystalline ZnO thin film with a c-axis-orientated wurtize structure is obtained at a growth temperature of 23 degreesC. X-ray diffraction shows that the full width at half maximum (FWHM) of (0 0 2) ZnO, located at 34.42degrees, is approximately 0.26degrees. A pronounced exciton absorption peak is observed in the absorption spectrum. The photoluminescence (PL) spectra show a strong ultraviolet (UV) band emission approximately 3.26 eV with a weak emission related to deep-level defects, implying that the ZnO thin films are nearly stoichiometric. The FWHMs of the PL spectra become narrower with increasing growth temperature. The origin of the UV band is from free exciton recombination, testified by the temperature dependent PL spectra in the range of 81-581 K (C) 2002 Elsevier Science B.V. All rights reserved.
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页码:170 / 174
页数:5
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