Preparation and dielectric properties of the multilayer capacitor with (Ba, Sr)TiO3 thin layers by metalorganic chemical vapor deposition

被引:43
作者
Takeshima, Y
Shiratsuyu, K
Takagi, H
Sakabe, Y
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1997年 / 36卷 / 9B期
关键词
metalorganic chemical vapor deposition; barium strontium titanate; ferroelectric thin film; dielectric constant; multilayer capacitor; perovskite;
D O I
10.1143/JJAP.36.5870
中图分类号
O59 [应用物理学];
学科分类号
摘要
Barium strontium titanate ((Ba, Sr)TiO3; BST) thin films were prepared on Pt-coated magnesium oxide single-crystal substrates (Pt(111)/MgO(100) and Pt(100)/MgO(100)) at 650 degrees C by metalorganic chemical vapor deposition (MOCVD). The BST films with a perovskite single phase were obtained. Their room-temperature dielectric constant was 400-590 measured at 100mV and 1kHz. The leakage current density was below the order of 10(-7) A/cm(2) at 3V, and the breakdown field was above 500kV/cm. In addition, the multilayer capacitor with five layers of BST was prepared. The room-temperature capacitance with an effective electrode area of 0.16 mm(2) was 20nF at 100mV and 1kHz. The leakage current was on the order of 10(-8) A at 1V, and on order of 10(-5) A at 3V.
引用
收藏
页码:5870 / 5873
页数:4
相关论文
共 13 条
[1]   FERROELECTRIC PROPERTIES IN EPITAXIALLY GROWN BAXSR1-XTIO3 THIN-FILMS [J].
ABE, K ;
KOMATSU, S .
JOURNAL OF APPLIED PHYSICS, 1995, 77 (12) :6461-6465
[2]  
BUSKIRK PCV, 1996, JPN J APPL PHYS, V35, P2520
[3]   MICROWAVE MEASUREMENT OF THE DIELECTRIC-CONSTANT OF SR0.5BA0.5TIO3 FERROELECTRIC THIN-FILMS [J].
CARROLL, KR ;
POND, JM ;
CHRISEY, DB ;
HORWITZ, JS ;
LEUCHTNER, RE ;
GRABOWSKI, KS .
APPLIED PHYSICS LETTERS, 1993, 62 (15) :1845-1847
[4]   HETEROEPITAXIAL GROWTH OF BA1-XSRXTIO3 YBA2CU3O7-X BY PLASMA-ENHANCED METALORGANIC CHEMICAL-VAPOR-DEPOSITION [J].
CHERN, CS ;
LIANG, S ;
SHI, ZQ ;
YOON, S ;
SAFARI, A ;
LU, P ;
KEAR, BH ;
GOODREAU, BH ;
MARKS, TJ ;
HOU, SY .
APPLIED PHYSICS LETTERS, 1994, 64 (23) :3181-3183
[5]   (Ba, Sr)TiO3 films prepared by liquid source chemical vapor deposition on Ru electrodes [J].
Kawahara, T ;
Yamamuka, M ;
Yuuki, A ;
Ono, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (9B) :4880-4885
[6]   STRUCTURAL AND ELECTRICAL-PROPERTIES OF RF MAGNETRON-SPUTTERED BA1-XSRXTIO3 THIN-FILMS ON INDIUM-TIN-OXIDE-COATED GLASS SUBSTRATE [J].
KIM, TS ;
KIM, CH ;
OH, MH .
JOURNAL OF APPLIED PHYSICS, 1994, 75 (12) :7998-8003
[7]   HETEROEPITAXIAL GROWTH OF QUATERNARY BAXSR1-XTIO3 THIN-FILMS BY ARF EXCIMER-LASER ABLATION [J].
KOBAYASHI, H ;
KOBAYASHI, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1994, 33 (4A) :L533-L536
[8]   ELECTRICAL-PROPERTIES AND CRYSTAL-STRUCTURE OF (BA0.5SR0.5)TIO3 THIN-FILMS PREPARED ON PT/SIO2/SI BY RF MAGNETRON SPUTTERING [J].
LEE, WJ ;
PARK, IK ;
JANG, GE ;
KIM, HG .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (01) :196-199
[9]   EFFECT OF OXYGEN-PRESSURE ON (BAXSR1-X)TIO3 THIN-FILMS BY PULSED LASER ABLATION [J].
NAKAMURA, T ;
YAMANAKA, Y ;
MORIMOTO, A ;
SHIMIZU, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (9B) :5150-5153
[10]   Time-dependent leakage current behavior of integrated Ba0-7Sr0.3TiO3 thin film capacitors during stressing [J].
Shimada, Y ;
Inoue, A ;
Nasu, T ;
Nagano, Y ;
Matsuda, A ;
Arita, K ;
Uemoto, Y ;
Fujii, E ;
Otsuki, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (9B) :4919-4924