Structural features of laser ablation particulate from Si target, as revealed by focused ion beam technology

被引:20
作者
Bleiner, D [1 ]
Gasser, P [1 ]
机构
[1] Swiss Fed Labs Mat Testing & Res, EMPA, CH-8600 Dubendorf, Switzerland
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2004年 / 79卷 / 4-6期
关键词
D O I
10.1007/s00339-004-2618-x
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Heterogeneity in laser-induced particle structures was investigated by scanning electron microscopy (SEM) and transmission electron microscopy (TEM) of individual particles micro-machined using focused ion beam (FIB). The primary particle size distribution spanned over three orders of magnitude, i.e., in the range 10 nm-10 mum with few larger secondary objects. The particulate larger than 0.5 mum often resulted from particle-particle aggregation, mostly upon a spherical core, seldom in chain-like structures. The core of these fractal aggregates was found to be polycrystalline. The heterogeneity of the particles with respect to structure and chemistry is surely of importance for elemental analysis using laser ablation as sample introduction technique.
引用
收藏
页码:1019 / 1022
页数:4
相关论文
共 19 条
[11]   The influence of ablation carrier gasses Ar, He and Ne on the particle size distribution and transport efficiencies of laser ablation-induced aerosols:: implications for LA-ICP-MS [J].
Horn, I ;
Günther, D .
APPLIED SURFACE SCIENCE, 2003, 207 (1-4) :144-157
[12]   Application of a frequency quintupled Nd:YAG source (λ = 213 nm) for laser ablation inductively coupled plasma mass spectrometric analysis of minerals [J].
Jeffries, TE ;
Jackson, SE ;
Longerich, HP .
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 1998, 13 (09) :935-940
[13]   Depth profiling of multi-layer samples using femtosecond laser ablation [J].
Margetic, V ;
Bolshov, M ;
Stockhaus, A ;
Niemax, K ;
Hergenröder, R .
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 2001, 16 (06) :616-621
[14]   The formation of trace element-enriched particulates during laser ablation of refractory materials [J].
Outridge, PM ;
Doherty, W ;
Gregoire, DC .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1996, 51 (12) :1451-1462
[15]   Novel FIB-based sample preparation technique for TEM analysis of ultra-thin gate oxide breakdown [J].
Reiner, JC ;
Gasser, P ;
Sennhauser, U .
MICROELECTRONICS RELIABILITY, 2002, 42 (9-11) :1753-1757
[16]   Femtosecond laser ablation ICP-MS [J].
Russo, RE ;
Mao, XL ;
Gonzalez, JJ ;
Mao, SS .
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 2002, 17 (09) :1072-1075
[17]   A mathematical framework for modeling the compositional depth profiles obtained by pulsed laser ablation [J].
St-Onge, L .
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 2002, 17 (09) :1083-1089
[18]   Nanoparticle formation by laser ablation [J].
Ullmann, M ;
Friedlander, SK ;
Schmidt-Ott, A .
JOURNAL OF NANOPARTICLE RESEARCH, 2002, 4 (06) :499-509
[19]   DIFFUSION-LIMITED AGGREGATION, A KINETIC CRITICAL PHENOMENON [J].
WITTEN, TA ;
SANDER, LM .
PHYSICAL REVIEW LETTERS, 1981, 47 (19) :1400-1403