Ultrashort pulse laser interaction with dielectrics and polymers

被引:188
作者
Krüger, J [1 ]
Kautek, W [1 ]
机构
[1] Fed Inst Mat Res & Testing, Lab Thin Film Technol, D-12205 Berlin, Germany
来源
POLYMERS AND LIGHT | 2004年 / 168卷
关键词
ablation; dielectrics; femtosecond laser; micromachining; polymers;
D O I
10.1007/b12683
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Femtosecond laser micromachining has excited vivid attention in various industrial fields and in medicine owing to the advantages of ultrashort laser pulses compared to long-pulse treatment. These are mainly the reduction of the laser fluence needed to induce ablation and the improvement of the contour sharpness of the laser-generated structures. Recently, special attention was paid to femtosecond laser experiments on nonabsorbing inorganic dielectrics. This is due to the fact that optical damage in dielectric optical elements limits the performance of high-power laser systems. Despite the fact that a large variety of organic polymers can be machined with excimer lasers successfully, the involvement of thermal processes can lead to an unsatisfactory quality of the structures. Ultrashort, fs-laser pulses might be an alternative for the treatment of polymers. Therefore, femtosecond laser machining investigations of dielectrics and polymers are reviewed in this paper. Similarities and differences of the ablation behavior of both material classes are discussed. The influence of the bandgap on the ablation threshold in dependence on the pulse duration, the enhancement of the machining precision with a shortening of the pulse duration, incubation phenomena, and morphological features appearing on the surface after femtosecond laser treatment are mentioned. Possible applications, e.g., in medicine and biosensors, are described.
引用
收藏
页码:247 / 289
页数:43
相关论文
共 100 条
[11]   Micro-lens arrays generated by UV laser irradiation of doped PMMA [J].
Beinhorn, F ;
Ihlemann, J ;
Luther, K ;
Troe, J .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1999, 68 (06) :709-713
[12]  
BEUERMANN T, 1990, MATER RES SOC SYMP P, V191, P37, DOI 10.1557/PROC-191-37
[13]  
Biowski R, 2000, J REFRACT SURG, V16, P23
[14]   LASER-INDUCED ELECTRIC BREAKDOWN IN SOLIDS [J].
BLOEMBER.N .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1974, QE10 (03) :375-386
[15]   Femtosecond laser damage of a high reflecting mirror [J].
Bonse, J ;
Baudach, S ;
Kautek, W ;
Welsch, E ;
Krüger, J .
THIN SOLID FILMS, 2002, 408 (1-2) :297-301
[16]   Femtosecond laser ablation of silicon-modification thresholds and morphology [J].
Bonse, J ;
Baudach, S ;
Krüger, J ;
Kautek, W ;
Lenzner, M .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2002, 74 (01) :19-25
[17]   Efficient removal of foxing from a medieval Ptolemaic map using a molecular fluorine laser at 157 nm [J].
Cefalas, AC ;
Sarantopoulou, E ;
Kollia, Z .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2001, 73 (05) :571-578
[18]   Mass spectroscopic and degassing characteristics of polymeric materials for 157 nm photolithography [J].
Cefalas, AC ;
Sarantopoulou, E ;
Argitis, P ;
Gogolides, E .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1999, 69 (Suppl 1) :S929-S933
[19]  
Chichkov BN, 1996, APPL PHYS A-MATER, V63, P109, DOI 10.1007/BF01567637
[20]   THERMAL RESPONSE OF METALS TO ULTRASHORT-PULSE LASER EXCITATION [J].
CORKUM, PB ;
BRUNEL, F ;
SHERMAN, NK ;
SRINIVASANRAO, T .
PHYSICAL REVIEW LETTERS, 1988, 61 (25) :2886-2889