Reflection-wavelength control method for layer-by-layer controlled x-ray multilayer mirrors

被引：6

作者：

Ishii, M

Iwai, S

Ueki, T

Aoyagi, Y

机构：

[1] Institute of Physical and Chemical Research (RIKEN), Saitama, 351-01

来源：

APPLIED OPTICS | 1997年 / 36卷 / 10期

关键词：

multiperiodic mirror; layer by layer; phase compensation;

D O I：

10.1364/AO.36.002152

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A reflection-wavelength control method for a layer-by-layer controlled x-ray multilayer mirror without interface roughness is proposed. The reflection wavelength of the multiperiodic mirror is found to be simply determined by a combination ratio of periodic layers. Multiperiodic x-ray mirrors with reflectance wavelengths at 3.374 nm (C VI 1s-2p) and 3.950 nm (Ca XVIII 3d-5f) are successfully designed. (C) 1997 Optical Society of America.

引用

页码：2152 / 2156

页数：5

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