Polycrystalline mercuric iodide detectors

被引：48

作者：

Schieber, M ^{[1
]}

Hermon, H ^{[1
]}

Zuck, A ^{[1
]}

Vilensky, A ^{[1
]}

Melekhov, L ^{[1
]}

Shatunovsky, R ^{[1
]}

Meerson, E ^{[1
]}

Saado, H ^{[1
]}

机构：

[1] Hebrew Univ Jerusalem, IL-91904 Jerusalem, Israel

来源：

MEDICAL APPLICATIONS OF PENETRATING RADIATION | 1999年 / 3770卷

关键词：

imaging; X-ray; polycrystalline; mercuric iodide;

D O I：

10.1117/12.368177

中图分类号：

R318 [生物医学工程];

学科分类号：

0831 ;

摘要：

The fabrication of polycrystalline HgI2 thick film detectors using the hot wall physical vapor phase deposition, (PVD) method is described. The X-ray response of these detectors to a radiological X-ray generator of 60 kVp has been studied using the current integration mode. The response expressed in mu A, the dark current expressed in pA/cm(2) and sensitivity expressed in mu C/R.cm(2) are given for these detectors for several thickness and grain sizes. The optimal sensitivity is compared with published data on the response to X-rays by polycrystalline PbI2 and A-Se detectors.

引用

页码：146 / 155

页数：10

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