Reliability comparison of BTEL and bilayer organic LEDs

被引:6
作者
Curless, J [1 ]
Rogers, S [1 ]
Kim, M [1 ]
Lent, M [1 ]
Shi, S [1 ]
Choong, VE [1 ]
Briscoe, C [1 ]
So, F [1 ]
机构
[1] Motorola Inc, Motorola Labs, Phys Sci Res Labs, Tempe, AZ 85284 USA
关键词
electroluminescence; light emission; reliability; organic light-emitting diode; organic light-emitting device;
D O I
10.1016/S0379-6779(99)00142-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Organic structures consisting of two distinct layers (bilayer), a hole transport layer and an electron transport/emitter layer are compared to structures using a bipolar transport and emitting layer (BTEL). Reverse bias and different duty cycle did not significantly affect reliability. The BTEL structure had significantly improved reliability compared to the bilayer structure. The relative change in device voltage was found to be linearly proportional to the relative change in luminance and the constant of proportionality was a function of the contact. This constant of proportionality can be used as a figure of merit for voltage increase during operation. The BTEL structure also gives improved reliability at elevated temperature. (C) 1999 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:53 / 56
页数:4
相关论文
共 6 条
[1]   MOLECULAR DESIGN OF HOLE TRANSPORT MATERIALS FOR OBTAINING HIGH DURABILITY IN ORGANIC ELECTROLUMINESCENT DIODES [J].
ADACHI, C ;
NAGAI, K ;
TAMOTO, N .
APPLIED PHYSICS LETTERS, 1995, 66 (20) :2679-2681
[2]   Organic light-emitting diodes with a bipolar transport layer [J].
Choong, VE ;
Shi, S ;
Curless, J ;
Shieh, CL ;
Lee, HC ;
So, F ;
Shen, J ;
Yang, J .
APPLIED PHYSICS LETTERS, 1999, 75 (02) :172-174
[3]   Systematic investigation of the effects of organic film structure on light emitting diode performance [J].
Joswick, MD ;
Campbell, IH ;
Barashkov, NN ;
Ferraris, JP .
JOURNAL OF APPLIED PHYSICS, 1996, 80 (05) :2883-2890
[4]   Formation and growth of black spots in organic light-emitting diodes [J].
McElvain, J ;
Antoniadis, H ;
Hueschen, MR ;
Miller, JN ;
Roitman, DM ;
Sheats, JR ;
Moon, RL .
JOURNAL OF APPLIED PHYSICS, 1996, 80 (10) :6002-6007
[5]   A chemical failure mechanism for aluminum(III) 8-hydroxyquinoline light-emitting devices [J].
Papadimitrakopoulos, F ;
Zhang, XM ;
Thomsen, DL ;
Higginson, KA .
CHEMISTRY OF MATERIALS, 1996, 8 (07) :1363-&
[6]   ELECTROLUMINESCENCE OF DOPED ORGANIC THIN-FILMS [J].
TANG, CW ;
VANSLYKE, SA ;
CHEN, CH .
JOURNAL OF APPLIED PHYSICS, 1989, 65 (09) :3610-3616