Wet oxidation of AlGaAs: The role of hydrogen

被引:49
作者
Ashby, CIH
Sullivan, JP
Choquette, KD
Geib, KM
Hou, HQ
机构
[1] Sandia National Laboratories, Albuquerque
关键词
D O I
10.1063/1.366156
中图分类号
O59 [应用物理学];
学科分类号
摘要
Wet oxidation of AlGaAs to form Al2O3 by the reduction of H+ from water to H produces intermediate As2O3. Reduction of As2O3 by H to elemental As enables the escape of arsenic from the oxidized film. Further reduction of As to AsH3 can provide another volatile As species. Formation of intermediate As is problematic for the use of wet oxidation in metal-insulator-semiconductor applications. The kinetic balance between As2O3 formation and As escape can explain the transition between the linear and parabolic time dependence of the wet oxidation of buried AlGaAs layers. The near-total suppression of wet oxidation by O-2 is attributed to the suppression of volatile product formation through consumption of atomic hydrogen by reaction with O-2 to form H2O in preference to the hydrogen reduction of As2O3. (C) 1997 American Institute of Physics.
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页码:3134 / 3136
页数:3
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