Theory of electrostatic probe microscopy:: A simple perturbative approach

被引:45
作者
Gómez-Moñivas, S [1 ]
Sáenz, JJ
Carminati, R
Greffet, JJ
机构
[1] Univ Autonoma Madrid, Dept Fis Mat Condensada, E-28049 Madrid, Spain
[2] Univ Autonoma Madrid, Inst Ciencia Mat Nicolas Cabrera, E-28049 Madrid, Spain
[3] Ecole Cent Paris, CNRS, Lab Energet Mol & Macroscop Combust, F-92295 Chatenay Malabry, France
关键词
D O I
10.1063/1.126528
中图分类号
O59 [应用物理学];
学科分类号
摘要
A theoretical approach to electrostatic scanning probe microscopy is presented. We show that a simple perturbation formula, originally derived in the context of scattering theory of electromagnetic waves, can be used to obtain the capacitance and the electrostatic force between a metallic tip and an inhomogeneous dielectric sample. For inhomogeneous thin dielectric films, the scanning probe signal is shown to be proportional to the convolution between an effective surface profile and a response function of the microscope. This provides a rigorous framework to address the resolution issue and the inverse problem. (C) 2000 American Institute of Physics. [S0003-6951(00)04820-8].
引用
收藏
页码:2955 / 2957
页数:3
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