Origin of the symmetric dimers in the Si(100) surface

被引:35
作者
Shigekawa, H [1 ]
Hata, K [1 ]
Miyake, K [1 ]
Ishida, M [1 ]
Ozawa, S [1 ]
机构
[1] UNIV TSUKUBA,CTR TARA,TSUKUBA ADV RES ALLIANCE,TSUKUBA,IBARAKI 305,JAPAN
来源
PHYSICAL REVIEW B | 1997年 / 55卷 / 23期
关键词
D O I
10.1103/PhysRevB.55.15448
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A phase defect consisting of a phase boundary in a dimer row was observed to exist and migrate in the symmetric dimer region of a Si(100) surface at about room temperature. When the phase defects migrate rapidly compared to the timescale of scanning tunneling microscopy (STM), it results in a symmetric image of dimers. In this case, since dimer flip-flop motion is limited to the domain boundaries of the dimer rows, most of the surface remains unchanged without the destruction of the 2x anticorrelation of the buckled dimers along the dimer rows. Considering the obtained results and the fact that the electronic structures obtained by photoemission spectroscopy at room temperature agree well with the theoretical results calculated for a surface with asymmetric dimer structures, the symmetric dimer structure observed at room temperature is concluded to be caused by the characteristic properties of the phase defects.
引用
收藏
页码:15448 / 15451
页数:4
相关论文
共 9 条
[1]   SCANNING TUNNELING MICROSCOPY OF SI(001) [J].
HAMERS, RJ ;
TROMP, RM ;
DEMUTH, JE .
PHYSICAL REVIEW B, 1986, 34 (08) :5343-5357
[2]   STREAK PATTERNS IN LOW-ENERGY-ELECTRON DIFFRACTION ON SI(001) [J].
KUBOTA, M ;
MURATA, Y .
PHYSICAL REVIEW B, 1994, 49 (07) :4810-4814
[3]  
MUNTZ AW, 1995, PHYS REV LETT, V74, P2244
[4]   ELECTRONIC-STRUCTURE OF SI(100)C(4X2) CALCULATED WITHIN THE GW APPROXIMATION [J].
NORTHRUP, JE .
PHYSICAL REVIEW B, 1993, 47 (15) :10032-10035
[5]   Dynamics of phasons; Phase defects formed on dimer rows, and related structural changes of the Si(100) surface at 80 K studied by scanning tunneling microscopy [J].
Shigekawa, H ;
Miyake, K ;
Ishida, M ;
Hata, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1997, 36 (3A) :L294-L297
[6]   Phase transition between c(4x2) and p(2x2) structures of the Si(100) surface at 6K caused by the fluctuation of phase defects on dimer rows due to dimer flip-flop motion [J].
Shigekawa, H ;
Miyake, K ;
Ishida, M ;
Hata, K ;
Oigawa, H ;
Nannichi, Y ;
Yoshizaki, R ;
Kawazu, A ;
Abe, T ;
Ozawa, T ;
Nagamura, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1996, 35 (8B) :L1081-L1084
[7]   Variable low-temperature scanning tunneling microscopy study of Si(001): Nature of the 2x1->c(2x4) phase transition [J].
Smith, AR ;
Men, FK ;
Chao, KJ ;
Shih, CK .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02) :914-917
[8]  
TROMP RM, 1987, PHYS REV LETT, V59, P2071
[9]   DIRECT OBSERVATION OF AN INCREASE IN BUCKLED DIMERS ON SI(001) AT LOW-TEMPERATURE [J].
WOLKOW, RA .
PHYSICAL REVIEW LETTERS, 1992, 68 (17) :2636-2639