Towards the integration of carbon nanotubes in microelectronics

被引:74
作者
Graham, AP [1 ]
Duesberg, GS [1 ]
Seidel, R [1 ]
Liebau, M [1 ]
Unger, E [1 ]
Kreupl, F [1 ]
Hönlein, W [1 ]
机构
[1] Infineon Technol AG, Corp Res CPR NP, D-81739 Munich, Germany
关键词
nanotubes; chemical vapour deposition; electrical properties; electronic device structures;
D O I
10.1016/j.diamond.2003.10.080
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The remarkable properties of carbon nanotubes (CNTs) make them especially interesting for microelectronic applications including interconnects and devices. The parallel integration of CNTs into circuits using microelectronics compatible processes is critical for their future application and implies the simultaneous processing of billions of CNTs. We present our concepts for CNT-based interconnects and vertical, surrounding-gate transistors for large-scale integration. In order to realise this, the precise placement of CNTs with lithographic methods and the controlled production of CNTs with defined properties is necessary. We demonstrate vertical interconnects (vias) made from multi-walled nanotubes and their electrical characteristics. Further, we show the CVD growth of single, isolated single-walled and multi-walled CNTs at lithographically defined locations suitable for single CNT devices. Self-aligned, single-walled CNT transistors have also been realised and their electrical performance characterised. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:1296 / 1300
页数:5
相关论文
共 16 条
[1]   Multilayered metal catalysts for controlling the density of single-walled carbon nanotube growth [J].
Delzeit, L ;
Chen, B ;
Cassell, A ;
Stevens, R ;
Nguyen, C ;
Meyyappan, M .
CHEMICAL PHYSICS LETTERS, 2001, 348 (5-6) :368-374
[2]   Growth of isolated carbon nanotubes with lithographically defined diameter and location [J].
Duesberg, GS ;
Graham, AP ;
Liebau, M ;
Seidel, R ;
Unger, E ;
Kreupl, F ;
Hoenlein, W .
NANO LETTERS, 2003, 3 (02) :257-259
[3]  
DUESBERG GS, 2003, IN PRESS DIAMOND REL
[4]   HELICAL MICROTUBULES OF GRAPHITIC CARBON [J].
IIJIMA, S .
NATURE, 1991, 354 (6348) :56-58
[5]  
Javey A, 2002, NANO LETT, V2, P929, DOI 10.1021/n1025647r
[6]   High-κ dielectrics for advanced carbon-nanotube transistors and logic gates [J].
Javey, A ;
Kim, H ;
Brink, M ;
Wang, Q ;
Ural, A ;
Guo, J ;
McIntyre, P ;
McEuen, P ;
Lundstrom, M ;
Dai, HJ .
NATURE MATERIALS, 2002, 1 (04) :241-246
[7]   Carbon nanotubes in interconnect applications [J].
Kreupl, F ;
Graham, AP ;
Duesberg, GS ;
Steinhögl, W ;
Liebau, M ;
Unger, E ;
Hönlein, W .
MICROELECTRONIC ENGINEERING, 2002, 64 (1-4) :399-408
[8]  
Kreupl F, 2002, SOLID STATE TECHNOL, V45, pS9
[9]  
Kreupl Franz, 2003, PHYS CHEM APPL NANOS, P525
[10]   Contact improvement of carbon nanotubes via electroless nickel deposition [J].
Liebau, M ;
Unger, E ;
Duesberg, GS ;
Graham, AP ;
Seidel, R ;
Kreupl, F ;
Hoenlein, W .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2003, 77 (06) :731-734