Electro-optic detection of subwavelength terahertz spot sizes in the near field of a metal tip

被引：187

作者：

van der Valk, NCJ ^{[1
]}

Planken, PCM ^{[1
]}

机构：

[1] Delft Univ Technol, Dept Appl Phys, Fac Sci Appl, NL-2628 CJ Delft, Netherlands

来源：

APPLIED PHYSICS LETTERS | 2002年 / 81卷 / 09期

关键词：

D O I：

10.1063/1.1503404

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report on a method to obtain a subwavelength resolution in terahertz time-domain imaging. In our method, a sharp copper tip is used to locally distort and concentrate the THz electric field. The distorted electric field, present mainly in the near field of the tip, is electro-optically measured in an (100) oriented GaP crystal. By raster scanning the tip along the surface of the crystal, we find the smallest THz spot size of 18 mum for frequencies from 0.1 to 2.5 THz. For our peak frequency of 0.15 THz, this corresponds to a resolution of lambda/110. Our setup has the potential to reach a resolution down to a few mum. (C) 2002 American Institute of Physics.

引用

页码：1558 / 1560

页数：3

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